Integrated Electrical and Optical Characterization of Silicon Films

R.K. Ahrenkiel, Research Professor at the Department of Metallurgical and Materials Engineering at the Colorado School of Mines gives four short presentations on Integrated Electrical and Optical Characterization of Silicon Films. His presentations are on the following: A Silicon Film Characterization Overview, Resonance-coupled Photoconductive Decay (RCPCD), Transmission Modulated PCD (TMPCD) which was invented at the Colorado School of Mines, and Microwave PCD Technique. Hit the play button to view the video.

  • Integrated Electrical and Optical Characterization of Silicon Films Overview R.K. Ahrenkiel Colorado School of Mines

  • Transmission Modulated PCD (TMPCD) R.K. Ahrenkiel Colorado School of Mines

  • Resonance-coupled Photoconductive Decay (RCPCD) R.K. Ahrenkiel Colorado School of Mines

  • Microwave PCD Technique R.K. Ahrenkiel Colorado School of Mines